NONDESTRUCTIVE MULTIPLE BREAKDOWN EVENTS IN VERY THIN SIO2-FILMS

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作者：
SUNE, J
FARRES, E
PLACENCIA, I
BARNIOL, N
MARTIN, F
AYMERICH, X
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APPLIED PHYSICS LETTERS | 1989年 / 55卷 / 02期
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O59 [应用物理学];
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页码：128 / 130
页数：3
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