共 50 条
- [42] THE METHOD FOR INDIVIDUAL DETERMINATION OF GELATINE LAYER THICKNESS AND REFRACTIVE-INDEX [J]. ZHURNAL NAUCHNOI I PRIKLADNOI FOTOGRAFII, 1989, 34 (06): : 471 - 474
- [43] INFLUENCE OF BURNISHING ON PROPERTIES OF SURFACE-LAYER [J]. MECHANIK MIESIECZNIK NAUKOWO-TECHNICZNY, 1977, 50 (07): : 347 - 349
- [48] CHEMICAL COMPOSITION OF SILICON SURFACE-LAYER IN VACUUM [J]. FIZIKA TVERDOGO TELA, 1974, 16 (08): : 2395 - 2396
- [49] IMPURITY HETEROGENEITIES IN THE SURFACE-LAYER OF SILICON WITH AN ATOMICALLY CLEAN SURFACE [J]. KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1978, 13 (12): : 1471 - 1477
- [50] MEASUREMENT OF THE REFRACTIVE-INDEX AND THERMAL REFRACTIVE-INDEX COEFFICIENTS OF ND-YAP CRYSTAL [J]. APPLIED OPTICS, 1990, 29 (09): : 1281 - 1286