共 50 条
- [1] OPTICAL INTERFERENCE METHOD FOR APPROXIMATE DETERMINATION OF REFRACTIVE-INDEX AND THICKNESS OF A TRANSPARENT LAYER [J]. APPLIED OPTICS, 1978, 17 (17): : 2779 - 2787
- [3] DETERMINATION OF LAYER THICKNESS AND REFRACTIVE-INDEX OF THE LAYERS OF MULTILAYER SYSTEMS BY ELLIPSOMETRY [J]. SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS, 1980, 9 (04): : 236 - 241
- [4] ON A METHOD FOR REFRACTIVE-INDEX DETERMINATION [J]. OPTIKA I SPEKTROSKOPIYA, 1989, 66 (03): : 629 - 632
- [7] ELLIPSOMETRIC DETERMINATION OF THE THICKNESS AND REFRACTIVE-INDEX OF SILICON FILMS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (06): : 2102 - 2106
- [8] DETERMINATION OF COMPLEX REFRACTIVE-INDEX AND THICKNESS OF A HOMOGENEOUS LAYER BY COMBINED REFLECTION AND TRANSMISSION ELLIPSOMETRY [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1994, 11 (07): : 2156 - 2158
- [9] DETERMINATION OF REFRACTIVE-INDEX OF A MEDIUM BY ELLIPSOMETRY METHOD [J]. OPTIKA I SPEKTROSKOPIYA, 1978, 44 (04): : 752 - 756