AN EMPIRICAL-APPROACH TO QUANTITATIVE-ANALYSIS OF BIOLOGICAL SAMPLES BY SECONDARY ION MASS-SPECTROMETRY (SIMS)

被引：0

作者：

TADANO, J

TAMURA, H

机构：

[1] SAGA MED SCH,DEPT LAB MED,SAGA 84001,JAPAN

[2] HITACHI INSTRUMENT ENGN CO LTD,KATSUTA,IBARAKI 312,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1990年 / 39卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：194 / 194

页数：1

共 50 条

[1] SURFACE, IN-DEPTH, AND QUANTITATIVE-ANALYSIS BY SECONDARY ION MASS-SPECTROMETRY (SIMS)
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01): : 297 - 297
[2] QUANTITATIVE-ANALYSIS OF IMPURITIES IN SIMOX SAMPLES USING SECONDARY ION MASS-SPECTROMETRY
CHI, PH
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ROITMAN, P
[J]. SURFACE AND INTERFACE ANALYSIS, 1991, 17 (01) : 57 - 61
[3] METHODS FOR QUANTITATIVE-ANALYSIS IN SECONDARY ION MASS-SPECTROMETRY
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[J]. SCANNING, 1980, 3 (02) : 110 - 118
[4] QUANTITATIVE-ANALYSIS OF ELECTRODEPOSIT ON STEEL BY SECONDARY ION MASS-SPECTROMETRY
SUZUKI, T
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TSUNOYAMA, K
[J]. TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1986, 72 (11): : 1775 - 1781
[5] QUANTITATIVE-ANALYSIS OF GLASSES AND SILICATES USING SECONDARY ION MASS-SPECTROMETRY
MORGAN, AE
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[J]. JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1977, 2 (01): : 88 - 88
[6] QUANTITATIVE-ANALYSIS BY SUB-MICRON SECONDARY ION MASS-SPECTROMETRY
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (03): : 915 - 918
[7] QUANTITATIVE-ANALYSIS IN CHEMICALLY DISSIMILAR MATRICES BY SECONDARY ION MASS-SPECTROMETRY
KATZ, W
SMITH, GA
WEI, CY
[J]. APPLIED SURFACE SCIENCE, 1983, 15 (1-4) : 247 - 254
[8] QUANTITATIVE-ANALYSIS OF IMPURITIES IN HGCDTE USING SECONDARY ION MASS-SPECTROMETRY
LAPIDES, LE
[J]. SURFACE AND INTERFACE ANALYSIS, 1985, 7 (05) : 211 - 216
[9] SECONDARY ION MASS-SPECTROMETRY (SIMS)
ODAWARA, O
[J]. DENKI KAGAKU, 1990, 58 (03): : 211 - 217
[10] SECONDARY ION MASS-SPECTROMETRY (SIMS)
SHINODA, G
[J]. JOURNAL OF ELECTRON MICROSCOPY, 1975, 24 (01): : 57 - 58

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