CHARACTERIZATION OF SURFACE-TOPOGRAPHY BY SCANNING PROBE MICROSCOPY

被引：0
|
作者：
ROSSET, E
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ANALUSIS | 1993年 / 21卷 / 08期
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中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
Characterizing a surface has always been of a key interest since its influence on the properties of a system has been recognized. It is quite surprising that we only start to have the tools to access and modelize the most visible and apparently the most accessible part of a system: its surface topography.
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页码：M23 / M24
页数：2
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