CHARACTERIZATION OF SURFACE-TOPOGRAPHY BY SCANNING PROBE MICROSCOPY

被引：0

作者：

ROSSET, E

机构：

来源：

ANALUSIS | 1993年 / 21卷 / 08期

关键词：

D O I：

暂无

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Characterizing a surface has always been of a key interest since its influence on the properties of a system has been recognized. It is quite surprising that we only start to have the tools to access and modelize the most visible and apparently the most accessible part of a system: its surface topography.

引用

页码：M23 / M24

页数：2

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