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OXIDE CHARGE TRAPPING INDUCED BY ION-IMPLANTATION IN SIO2
被引:22
|
作者
:
HARARI, E
论文数:
0
引用数:
0
h-index:
0
机构:
PRINCETON UNIV,SOLID STATE & MAT LAB,PRINCETON,NJ 08540
PRINCETON UNIV,SOLID STATE & MAT LAB,PRINCETON,NJ 08540
HARARI, E
[
1
]
ROYCE, BSH
论文数:
0
引用数:
0
h-index:
0
机构:
PRINCETON UNIV,SOLID STATE & MAT LAB,PRINCETON,NJ 08540
PRINCETON UNIV,SOLID STATE & MAT LAB,PRINCETON,NJ 08540
ROYCE, BSH
[
1
]
机构
:
[1]
PRINCETON UNIV,SOLID STATE & MAT LAB,PRINCETON,NJ 08540
来源
:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
|
1973年
/ NS20卷
/ 06期
关键词
:
D O I
:
10.1109/TNS.1973.4327409
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:288 / 292
页数:5
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