4-PROBE INSTRUMENT FOR RESISTIVITY MEASUREMENTS OF GERMANIUM AND SILICON

被引：6

|

作者：

MACDONALD, AL

SOLED, J

STEARNS, CA

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1953年 / 24卷 / 09期

关键词：

D O I：

10.1063/1.1770869

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：884 / 885

页数：2

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