4-PROBE INSTRUMENT FOR RESISTIVITY MEASUREMENTS OF GERMANIUM AND SILICON

被引：6
|
作者：
MACDONALD, AL
SOLED, J
STEARNS, CA
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1953年 / 24卷 / 09期
关键词：
D O I：
10.1063/1.1770869
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：884 / 885
页数：2
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