DETERMINATION OF THE MINORITY-CARRIER LIFETIME IN SEMICONDUCTORS EXCITED BY AN ELECTRON-BEAM IN A SCANNING ELECTRON-MICROSCOPE

被引：0

作者：

KONNIKOV, SG

UMANSKII, VE

CHISTYAKOV, VM

LODYZHENSKII, II

机构：

来源：

SOVIET PHYSICS SEMICONDUCTORS-USSR | 1988年 / 22卷 / 10期

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D O I：

暂无

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：1140 / 1143

页数：4

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