ELECTRON-BEAM CRYSTALLIZATION OF AMORPHOUS-GERMANIUM FILMS IN THE ELECTRON-MICROSCOPE

被引:8
|
作者
FITZGERALD, AG
机构
关键词
D O I
10.1007/BF00730943
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:145 / 146
页数:2
相关论文
共 50 条
  • [1] CRYSTALLIZATION OF AMORPHOUS-GERMANIUM SELENIDE FILMS IN THE TRANSMISSION ELECTRON-MICROSCOPE
    FITZGERALD, AG
    MCHARDY, CP
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1984, 3 (01) : 91 - 92
  • [2] ELECTRON-MICROSCOPE INVESTIGATION OF STRUCTURES OF AMORPHOUS-GERMANIUM FILMS
    NODA, M
    ARIZUMI, T
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1976, 15 (03) : 557 - 558
  • [3] ELECTRON-BEAM INDUCED EXPLOSIVE CRYSTALLIZATION OF UNSUPPORTED AMORPHOUS-GERMANIUM THIN-FILMS
    SHARMA, RK
    BANSAL, SK
    NATH, R
    MEHRA, RM
    BAHADUR, K
    MALL, RP
    CHAUDHARY, KL
    GARG, CL
    JOURNAL OF APPLIED PHYSICS, 1984, 55 (02) : 387 - 394
  • [4] INSITU CRYSTALLIZATION OF AMORPHOUS-GERMANIUM UNDER LASER IRRADIATION IN A TRANSMISSION ELECTRON-MICROSCOPE
    PIERRARD, P
    MUTAFTSCHIEV, B
    MARINE, W
    MARFAING, J
    SALVAN, F
    THIN SOLID FILMS, 1984, 111 (02) : 141 - 148
  • [5] OPTICAL AND ELECTRON-MICROSCOPE STUDY OF GROWTH AND ETCHING BEHAVIOR OF ELECTROLYTIC AMORPHOUS-GERMANIUM
    PAPA, T
    SETTE, D
    STAGNI, L
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1974, 7 (15) : 2024 - 2030
  • [6] ELECTRON-BEAM CURRENT MEASUREMENT IN THE ELECTRON-MICROSCOPE
    NICHOLSON, WAP
    JOURNAL OF MICROSCOPY-OXFORD, 1981, 121 (FEB): : 141 - 147
  • [7] CRYSTALLIZATION OF AMORPHOUS-GERMANIUM FILMS
    NAKHODKIN, NG
    BARDAMID, AF
    NOVOSELSKAYA, AI
    YAKIMOV, KI
    FIZIKA TVERDOGO TELA, 1987, 29 (03): : 715 - 720
  • [8] ON THE CRYSTALLIZATION OF AMORPHOUS-GERMANIUM FILMS
    EDELMAN, F
    KOMEM, Y
    BENDAYAN, M
    BESERMAN, R
    APPLIED SURFACE SCIENCE, 1993, 70-1 (1 -4 pt B) : 727 - 730
  • [9] ELECTRON TUNNELING INTO AMORPHOUS-GERMANIUM
    OSMUN, JW
    PHYSICAL REVIEW B, 1975, 11 (12): : 5008 - 5022
  • [10] LASER CRYSTALLIZATION OF AMORPHOUS-GERMANIUM FILMS
    FAN, JCC
    CHAPMAN, RL
    GALE, RP
    ZEIGER, HJ
    JOURNAL OF ELECTRONIC MATERIALS, 1979, 8 (05) : 730 - 730