ELECTRON-BEAM CURRENT MEASUREMENT IN THE ELECTRON-MICROSCOPE

被引：12

|

作者：

NICHOLSON, WAP

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1981年 / 121卷 / FEB期

关键词：

D O I：

10.1111/j.1365-2818.1981.tb01207.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

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页码：141 / 147

页数：7

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