共 50 条
- [1] DEVICE FOR PRECISE ALIGNMENT OF ELECTRON-BEAM AND SAMPLE IN SCANNING ELECTRON-MICROSCOPE JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1977, 10 (10): : 1076 - 1077
- [4] ELECTRON-BEAM CURRENT MEASUREMENT IN THE ELECTRON-MICROSCOPE JOURNAL OF MICROSCOPY-OXFORD, 1981, 121 (FEB): : 141 - 147
- [6] LOW-COST ELECTRON-BEAM LITHOGRAPHY PACKAGE FOR THE SCANNING ELECTRON-MICROSCOPE APPLIED OPTICS, 1988, 27 (02): : 196 - 196
- [7] ELECTRON-MICROSCOPE TRANSMISSION ELECTRON-MICROSCOPE AND SCANNING ELECTRON-MICROSCOPE DENKI KAGAKU, 1986, 54 (08): : 667 - 670
- [8] NEW METHOD FOR DIRECTLY MONITORING THE ELECTRON-BEAM INTENSITY PROFILE IN A SCANNING ELECTRON-MICROSCOPE REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (08): : 2650 - 2652
- [9] SCANNING ELECTRON-MICROSCOPE ATTACHMENT FOR ELECTRON-MICROSCOPE JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (03): : 256 - 256