共 50 条
- [1] SECONDARY ION MASS-SPECTROMETRY (SIMS) [J]. JOURNAL OF ELECTRON MICROSCOPY, 1975, 24 (01): : 57 - 58
- [3] SECONDARY ION MASS-SPECTROMETRY (SIMS) [J]. PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1984, 8 (1-2): : 11 - 57
- [4] CHARACTERIZATION AND REMOVAL OF ION YIELD TRANSIENTS IN THE NEAR-SURFACE REGION OF SECONDARY ION MASS-SPECTROMETRY DEPTH PROFILES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (01): : 9 - 14
- [5] MATERIALS CHARACTERIZATION USING SECONDARY ION MASS-SPECTROMETRY (SIMS) [J]. SCANNING ELECTRON MICROSCOPY, 1984, : 1557 - 1566
- [7] MOLECULAR SECONDARY ION MASS-SPECTROMETRY (SIMS) [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03): : 737 - 747
- [9] SURFACE-ANALYSIS BY SECONDARY-ION MASS-SPECTROMETRY (SIMS) [J]. SURFACE SCIENCE, 1994, 299 (1-3) : 246 - 260
- [10] CHARACTERIZATION OF POLYMERS USING STATIC SECONDARY ION MASS-SPECTROMETRY (SIMS) [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1988, 196 : 154 - PMSE