共 50 条
- [35] SECONDARY ION MASS-SPECTROSCOPY (SIMS) STUDY OF LINBO3 FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1987, 329 (2-3): : 240 - 241
- [36] COMBINED USE OF 4 METHODS FOR ANALYSIS OF CORROSION OF CONNECTOR CONTACT COATINGS - SCANNING ELECTRON-MICROSCOPY WITH ENERGY-DISPERSIVE ELECTRON-BEAM MICROANALYSIS, AUGER-ELECTRON SPECTROSCOPY, ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS AND SECONDARY ION MASS-SPECTROSCOPY ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-LEIPZIG, 1990, 271 (05): : 949 - 964
- [37] LANGMUIR-BLODGETT-FILM METAL INTERFACES - STATIC SECONDARY ION MASS-SPECTROMETRY AND ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS ACS SYMPOSIUM SERIES, 1990, 440 : 379 - 393
- [40] SURFACE-CHEMISTRY OF BUSINESS PAPERS - ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS STUDIES ACS SYMPOSIUM SERIES, 1982, 200 : 455 - 474