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- [3] DIFFUSION ANALYSIS USING SECONDARY ION MASS-SPECTROSCOPY (SIMS) JOURNAL OF METALS, 1983, 35 (08): : A50 - A50
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- [9] SECONDARY ION MASS-SPECTROSCOPY ANALYSIS OF MOISTURE PENETRATION OF DIELECTRIC FILMS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (04): : 1893 - 1896