SECONDARY ION MASS-SPECTROSCOPY (SIMS)

被引：0
|
作者：
SROUBEK, Z [1 ]
ZAVADIL, J [1 ]
KUBEC, F [1 ]
机构：
[1] CESKOSLOVENSKA AKAD VED,USTAV RADIOTECH & ELEKTR,CS-18088 PRAHA 8,FRANCE
来源：
CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A | 1977年 / 27卷 / 05期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：451 / 459
页数：9
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