SECONDARY-ION MASS-SPECTROSCOPY (SIMS) IN THE ANALYSIS OF ELEMENTAL MICROPATTERNS IN TREE-RINGS

被引：5
|
作者：
MARTIN, RR
SYLVESTER, T
BIESINGER, MC
机构：
来源：
CANADIAN JOURNAL OF FOREST RESEARCH-REVUE CANADIENNE DE RECHERCHE FORESTIERE | 1994年 / 24卷 / 11期
关键词：
D O I：
10.1139/x94-298
中图分类号：
S7 [林业];
学科分类号：
0829 ; 0907 ;
摘要：
Secondary ion mass spectroscopy (SIMS) has been used to examine elemental micropatterns in tree rings. Elevated potassium was detected in discrete rings, suggesting that this technique may have a wide application in dendrochronology.
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收藏
页码：2312 / 2313
页数：2
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