DIFFUSION ANALYSIS USING SECONDARY ION MASS-SPECTROSCOPY (SIMS)

被引：0
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作者：
PETUSKY, WT [1 ]
机构：
[1] UNIV ILLINOIS,DEPT CERAM ENGN,URBANA,IL 61801
来源：
JOURNAL OF METALS | 1983年 / 35卷 / 08期
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中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
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页码：A50 / A50
页数：1
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