XPS MEASUREMENTS OF ABRUPT GE-GAAS HETEROJUNCTION INTERFACES

被引：45

|

作者：

GRANT, RW

WALDROP, JR

KRAUT, EA

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1978年 / 15卷 / 04期

关键词：

D O I：

10.1116/1.569806

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1451 / 1455

页数：5

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