MONITORING THE DEPTH OF THE DAMAGED SURFACE-LAYER OF SINGLE-CRYSTAL FERRITE

This paper discusses a method for estimating the depth of the damaged layer, based on a comparison of the characteristics obtained by various independent test methods: Auger spectroscopy, x-ray diffraction reflection, ellipsometry, and electron microscopy. The ellipsometric test method is recommended as the main way to estimate the depth of the damaged layer of single-crystal ferrite by comparing the described calculation of the polarization angle of the test sample and a standard.