MONITORING THE DEPTH OF THE DAMAGED SURFACE-LAYER OF SINGLE-CRYSTAL FERRITE

被引：0
|
作者：
MASLOV, VP
MELNIK, TS
SHULMAN, MG
机构：
来源：
JOURNAL OF OPTICAL TECHNOLOGY | 1994年 / 61卷 / 06期
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中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
This paper discusses a method for estimating the depth of the damaged layer, based on a comparison of the characteristics obtained by various independent test methods: Auger spectroscopy, x-ray diffraction reflection, ellipsometry, and electron microscopy. The ellipsometric test method is recommended as the main way to estimate the depth of the damaged layer of single-crystal ferrite by comparing the described calculation of the polarization angle of the test sample and a standard.
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页码：427 / 429
页数：3
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