EARLY VOLTAGE UNIQUENESS TEST FOR BIPOLAR JUNCTION TRANSISTORS

被引：1

|

作者：

HART, BL

机构：

来源：

ELECTRONICS LETTERS | 1980年 / 16卷 / 18期

关键词：

D O I：

10.1049/el:19800499

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：703 / 705

页数：3

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