STANDARD BASES, CRITICAL TROPISMS AND FLATNESS

被引：8

作者：

ASSI, A ^{[1
]}

机构：

[1] UNIV NICE SOPHIA ANTIPOLIS,LAB J A DIEUDONNE,CNRS,URA 168,F-06108 NICE 02,FRANCE

来源：

APPLICABLE ALGEBRA IN ENGINEERING COMMUNICATION AND COMPUTING | 1993年 / 4卷 / 03期

关键词：

HIRONAKA DIVISION; STANDARD BASES; NEWTON POLYGON; CRITICAL TROPISMS; GENERIC FLATNESS;

D O I：

10.1007/BF01202038

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

Using the standard basis notion, we adapt to the affine algebraic geometry the notion of the critical tropisms of Lejeune-Teissier and we give some effective criteria for testing geometrical properties for the generic projection X = Spec K[t1,...,t(m)] [x1,...,x(n)]/I --> Y = Spec K[t1,...,t(m)].

引用

页码：197 / 215

页数：19

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