STANDARD BASES, CRITICAL TROPISMS AND FLATNESS

被引：8
|
作者：
ASSI, A [1 ]
机构：
[1] UNIV NICE SOPHIA ANTIPOLIS,LAB J A DIEUDONNE,CNRS,URA 168,F-06108 NICE 02,FRANCE
来源：
APPLICABLE ALGEBRA IN ENGINEERING COMMUNICATION AND COMPUTING | 1993年 / 4卷 / 03期
关键词：
HIRONAKA DIVISION; STANDARD BASES; NEWTON POLYGON; CRITICAL TROPISMS; GENERIC FLATNESS;
D O I：
10.1007/BF01202038
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
Using the standard basis notion, we adapt to the affine algebraic geometry the notion of the critical tropisms of Lejeune-Teissier and we give some effective criteria for testing geometrical properties for the generic projection X = Spec K[t1,...,t(m)] [x1,...,x(n)]/I --> Y = Spec K[t1,...,t(m)].
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页码：197 / 215
页数：19
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