A METHOD FOR MEASURING THE RATE OF SURFACE RECOMBINATION IN ACCORDANCE WITH THE VARIATION OF THE RESISTANCE OF A SEMICONDUCTOR IN A MAGNETIC FIELD

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ZHUZE, VP
PIKUS, GE
SOROKIN, OV
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SOVIET PHYSICS-TECHNICAL PHYSICS | 1957年 / 2卷 / 06期
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O59 [应用物理学];
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页码：1061 / 1067
页数：7
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