CORROSION TEST FOR METALLIZATION OF SEMICONDUCTOR-DEVICES

被引：0
|
作者：
IWATA, S [1 ]
ISHIZAKA, A [1 ]
YAMAMOTO, H [1 ]
机构：
[1] HITACHI LTD,CENT RES LAB,TOKYO 185,JAPAN
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1977年 / 124卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
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页码：C99 / C99
页数：1
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