INVESTIGATION OF FIELD EMITTING MICROSTRUCTURES BY SCANNING ELECTRON AND SCANNING TUNNELING MICROSCOPY

被引：0
|
作者：
NIEDERMANN, P
RENNER, C
KENT, AD
FISCHER, O
机构：
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1989年 / 99期
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D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
A study of enhanced field emission on broad area niobium cathodes is presented. Emitting sites have been investigated by field emission scans, scanning electron microscopy and scanning tunneling microscopy. All except one of 14 studied emitters are of micron or submicron size. A trend is observed for the emitting structures to be smaller than predicted from the protrusion model as is also demonstrated with the aid of a specific example of a field emitting site.
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页码：173 / 176
页数：4
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