PHOTOCAPACITY PROBING OF SI-SIO2 INTERFACE STATES

被引：0
|
作者：
KAMIENIECKI, E [1 ]
NITECKI, R [1 ]
机构：
[1] POLISH ACAD SCI,INST PHYS,WARSAW 42,POLAND
来源：
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1978年 / 23卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：463 / 463
页数：1
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