RADIATION HARDNESS ASSURANCE OF SPACE ELECTRONICS

被引:1
|
作者
ADAMS, L [1 ]
HOLMESSIEDLE, A [1 ]
机构
[1] REM,OXFORD,ENGLAND
关键词
D O I
10.1016/0168-9002(92)90977-C
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Space radiation causes significant damage to electronic components and the performance of any spacecraft is governed by the performance of the various electronic systems such as scientific instruments, data handling and communications. Instruments for space research employ highly complex electronics and there is an increasing emphasis on imaging instruments which require large amounts of memory and powerful advanced data processing. Scientific payloads are heavily constrained in terms of mass, volume and power, which requires the electronic designer to use low power technologies with a high level of integration. Such technologies are generally very sensitive to radiation effects. The hardening of space electronics against radiation affects is discussed and, in particular, the discipline of "Hardness Assurance" covering test, analysis and countermeasures at electronic system and component level is described.
引用
收藏
页码:335 / 344
页数:10
相关论文
共 50 条
  • [41] Inclusion of Radiation Environment Variability in Total Dose Hardness Assurance Methodology
    Xapsos, M. A.
    Stauffer, C.
    Phan, A.
    McClure, S. S.
    Ladbury, R. L.
    Pellish, J. A.
    Campola, M. J.
    LaBel, K. A.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2017, 64 (01) : 325 - 331
  • [42] HARDNESS ASSURANCE AND OVERTESTING
    NAMENSON, AI
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (06) : 1821 - 1826
  • [43] Radiation Hardness Assurance Methodology of Radiation Tolerant Power Converter Controls for Large Hadron Collider
    Uznanski, Slawosz
    Todd, Benjamin
    Dinius, Arend
    King, Quentin
    Brugger, Markus
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2014, 61 (06) : 3694 - 3700
  • [44] Radiation Hardness Assurance Methodology of Radiation Tolerant Power Converter Controls for Large Hadron Collider
    Uznanski, Slawosz
    Todd, Benjamin
    Dinius, Arend
    King, Quentin
    Brugger, Markus
    2013 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (NSS/MIC), 2013,
  • [45] Radiation Hardness Assurance Testing of Raspberry Pi Boards in the PULSTAR Research Reactor
    Hanson, S. C.
    McDonell, S. M.
    Charrette, R. J.
    Hayes, R. B.
    HEALTH PHYSICS, 2023, 125 (01): : 59 - 59
  • [46] Evaluation of Radiation Hardness of the Bipolar Devices in the Space Conditions
    Rodin, A. S.
    Bakerenkov, A. S.
    Felitsyn, V. A.
    Pershenkov, V. S.
    Telets, V. A.
    4TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGIES AND BIOMEDICAL ENGINEERING, ICNBME-2019, 2020, 77 : 807 - 810
  • [47] Radiation hardness of semiconductor laser diodes for space communication
    Li, Manyang
    Shen, Chao
    Sun, Zhenyu
    Xu, Bo
    Zhao, Chao
    Wang, Zhanguo
    APPLIED PHYSICS REVIEWS, 2024, 11 (02)
  • [48] Measuring the radiation hardness of terahertz devices for space applications
    He, Yuan-Zhi
    Ma, Chen-Sheng
    Yin, Hao
    COMMUNICATIONS PHYSICS, 2024, 7 (01):
  • [49] TOTAL-DOSE RADIATION AND ANNEALING STUDIES - IMPLICATIONS FOR HARDNESS ASSURANCE TESTING
    WINOKUR, PS
    SEXTON, FW
    SCHWANK, JR
    FLEETWOOD, DM
    DRESSENDORFER, PV
    WROBEL, TF
    TURPIN, DC
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) : 1343 - 1351
  • [50] Fault Simulation and Emulation Tools to Augment Radiation-Hardness Assurance Testing
    Quinn, Heather M.
    Black, Dolores A.
    Robinson, William H.
    Buchner, Stephen P.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2013, 60 (03) : 2119 - 2142