Inclusion of Radiation Environment Variability in Total Dose Hardness Assurance Methodology

被引：21

作者：

Xapsos, M. A. ^{[1
]}

Stauffer, C. ^{[2
]}

Phan, A. ^{[2
]}

McClure, S. S. ^{[3
]}

Ladbury, R. L. ^{[1
]}

Pellish, J. A. ^{[1
]}

Campola, M. J. ^{[1
]}

LaBel, K. A. ^{[1
]}

机构：

[1] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA

[2] AS&D Inc, Greenbelt, MD 20771 USA

[3] CALTECH, Jet Prop Lab, 4800 Oak Grove Dr, Pasadena, CA 91125 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2017年 / 64卷 / 01期

关键词：

Displacement damage dose; radiation design margin; radiation hardness assurance; total ionizing dose; MODEL;

D O I：

10.1109/TNS.2016.2607021

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Variability of the space radiation environment is investigated with regard to parts categorization for total dose hardness assurance methods. It is shown that it can have a significant impact. A modified approach is developed that uses current environment models more consistently and replaces the radiation design margin concept with one of failure probability during a mission.

引用

页码：325 / 331

页数：7

共 50 条

[1] Total-dose radiation hardness assurance
Fleetwood, DM
Eisen, HA
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2003, 50 (03) : 552 - 564
[2] TOTAL DOSE HARDNESS ASSURANCE FOR MICROCIRCUITS FOR SPACE ENVIRONMENT
BUCHMAN, P
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) : 1352 - 1358
[3] TOTAL DOSE HARDNESS ASSURANCE FOR MICROCIRCUITS FOR SPACE ENVIRONMENT.
Buchman, Paltiel
IEEE Transactions on Nuclear Science, 1986, NS-33 (06)
[4] Total dose hardness assurance testing using laboratory radiation sources
Paillet, P
Schwank, JR
Shaneyfelt, MR
Ferlet-Cavrois, V
Jones, RL
Flament, O
Blackmore, EW
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2003, 50 (06) : 2310 - 2315
[5] TOTAL-DOSE RADIATION AND ANNEALING STUDIES - IMPLICATIONS FOR HARDNESS ASSURANCE TESTING
WINOKUR, PS
SEXTON, FW
SCHWANK, JR
FLEETWOOD, DM
DRESSENDORFER, PV
WROBEL, TF
TURPIN, DC
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) : 1343 - 1351
[6] TOTAL-DOSE HARDNESS ASSURANCE-TESTING FOR CMOS DEVICES IN SPACE ENVIRONMENT
KAMIMURA, H
SAKAGAMI, M
UCHIDA, S
KATO, M
PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM, 1992, (SYM): : 202 - 209
[7] TOTAL-DOSE RADIATION AND ANNEALING STUDIES: IMPLICATIONS FOR HARDNESS ASSURANCE TESTING.
Winokur, P.S.
Sexton, F.W.
Schwank, J.R.
Fleetwood, D.M.
Dressendorfer, P.V.
Wrobel, T.F.
Turpin, D.C.
IEEE Transactions on Nuclear Science, 1986, NS-33 (06)
[8] A Bayesian Approach for Total Ionizing Dose Hardness Assurance
Ladbury, R.
Triggs, B.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2011, 58 (06) : 3004 - 3010
[9] Proposal of a Lightened Radiation Hardness Assurance Methodology for New Space
Bezerra, Francoise
Mekki, Julien
Augustin, Gerald
Guillermin, Jeremy
Chatry, Nathalie
2021 21ST EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS), 2021, : 210 - 215
[10] A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment
Pease, RL
Cohn, LM
Fleetwood, DM
Gehlhausen, MA
Turflinger, TL
Brown, DB
Johnston, AH
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) : 1981 - 1988

← 1 2 3 4 5 →