RADIATION HARDNESS ASSURANCE OF SPACE ELECTRONICS

被引:1
|
作者
ADAMS, L [1 ]
HOLMESSIEDLE, A [1 ]
机构
[1] REM,OXFORD,ENGLAND
关键词
D O I
10.1016/0168-9002(92)90977-C
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Space radiation causes significant damage to electronic components and the performance of any spacecraft is governed by the performance of the various electronic systems such as scientific instruments, data handling and communications. Instruments for space research employ highly complex electronics and there is an increasing emphasis on imaging instruments which require large amounts of memory and powerful advanced data processing. Scientific payloads are heavily constrained in terms of mass, volume and power, which requires the electronic designer to use low power technologies with a high level of integration. Such technologies are generally very sensitive to radiation effects. The hardening of space electronics against radiation affects is discussed and, in particular, the discipline of "Hardness Assurance" covering test, analysis and countermeasures at electronic system and component level is described.
引用
收藏
页码:335 / 344
页数:10
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