REAL-TIME OBSERVATION OF ALAS/GAAS SUPERLATTICE GROWTH BY COAXIAL IMPACT COLLISION ION-SCATTERING SPECTROSCOPY

被引:6
|
作者
SUGIYAMA, N [1 ]
HASHIMOTO, A [1 ]
TAMURA, M [1 ]
机构
[1] OPTOELECTR TECHNOL RES LAB, TSUKUBA, IBARAKI 30026, JAPAN
关键词
INSITU MONITORING; ION-SCATTERING SPECTROSCOPY; CAICISS; GAAS; MBE; REAL-TIME OBSERVATION;
D O I
10.1143/JJAP.30.L1576
中图分类号
O59 [应用物理学];
学科分类号
摘要
Monitoring of the layer-by-layer growth of an AlAs/GaAs superlattice is performed using coaxial impact-collision ion-scattering spectroscopy. By exploiting high-frequency time-of-flight analysis, real-time observations of the intensity variation from Ga signals, which indicates the surface coverage of GaAs, are achieved. The intensity increases when GaAs is grown on AlAs, and the rise time of the intensity variation agrees well with the time for one-monolayer growth of GaAs.
引用
收藏
页码:L1576 / L1578
页数:3
相关论文
共 50 条
  • [31] ANALYSIS OF THE HFC(111) SURFACE-STRUCTURE BY IMPACT COLLISION ION-SCATTERING SPECTROSCOPY (ICISS)
    HAYAMI, W
    SOUDA, R
    AIZAWA, T
    OTANI, S
    ISHIZAWA, Y
    SURFACE SCIENCE, 1992, 276 (1-3) : 299 - 307
  • [32] STRUCTURE-ANALYSIS OF OXYGEN ADSORBED TIC(111) BY IMPACT COLLISION ION-SCATTERING SPECTROSCOPY
    SOUDA, R
    OSHIMA, C
    OTANI, S
    ISHIZAWA, Y
    AONO, M
    SURFACE SCIENCE, 1988, 199 (1-2) : 154 - 164
  • [33] Atom-rearrangement in Ge layer grown on Si substrate during anneal observed in real time by coaxial impact collision ion scattering spectroscopy
    Saitoh, T.
    Tamura, M.
    Palmer, J.E.
    Yodo, T.
    Journal of Crystal Growth, 1995, 150 (1 -4 pt 2): : 955 - 959
  • [34] DEVELOPMENT OF CAICISS (COAXIAL IMPACT-COLLISION ION SCATTERING SPECTROSCOPY) EQUIPMENT AND ITS APPLICATION
    Hayashi, Shigeki
    Marui, Takao
    Teramoto, Akira
    Mitamura, Shigehiro
    Watanabe, Kazuyuki
    Soezima, Hiroyoshi
    Katayama, Mitsuhiro
    Aono, Masakazu
    ANALYTICAL SCIENCES, 1991, 7 : 443 - 446
  • [35] In situ monitoring of surface processes in plasma by coaxial impact-collision ion scattering spectroscopy
    Fujii, S
    Katayama, M
    Michishita, Y
    Oura, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (4A): : 1911 - 1914
  • [36] In situ monitoring of surface processes in plasma by coaxial impact-collision ion scattering spectroscopy
    Fujii, Shunjiro
    Katayama, Mitsuhiro
    Michishita, Yusuke
    Oura, Kenjiro
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2005, 44 (4 A): : 1911 - 1914
  • [37] Atomic structure of Si(113) surface studied by coaxial impact collision ion scattering spectroscopy
    Kim, KS
    Choi, JU
    Cho, YJ
    Kang, HJ
    SURFACE AND INTERFACE ANALYSIS, 2003, 35 (01) : 80 - 83
  • [38] Identification of topmost atom on InP (001) surface by coaxial impact collision ion scattering spectroscopy
    Nishihara, T
    Shinohara, M
    Ishiyama, O
    Ohtani, F
    JOURNAL OF ELECTRONIC MATERIALS, 1996, 25 (04) : 667 - 670
  • [39] Structural study of initial growth of nickel on yttria-stabilized zirconia by coaxial impact-collision ion scattering spectroscopy
    Saito, A
    Yamasaki, K
    Takami, K
    Ohnisi, S
    Akai-Kasaya, M
    Aono, M
    Kuwahara, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (4B): : 2630 - 2633
  • [40] REAL-TIME INSITU OBSERVATION OF (001) GAAS IN OMCVD BY REFLECTANCE DIFFERENCE SPECTROSCOPY
    KAMIYA, I
    ASPNES, DE
    TANAKA, H
    FLOREZ, LT
    COLAS, E
    HARBISON, JP
    BHAT, R
    APPLIED SURFACE SCIENCE, 1992, 60-1 : 534 - 543