ROLE OF TEST CHIPS IN COORDINATING LOGIC AND CIRCUIT-DESIGN AND LAYOUT AIDS FOR VLSI

被引：0
|
作者：
BUEHLER, MG [1 ]
LINHOLM, LW [1 ]
机构：
[1] NBS,WASHINGTON,DC 20234
来源：
SOLID STATE TECHNOLOGY | 1981年 / 24卷 / 09期
关键词：
Compilation and indexing terms; Copyright 2025 Elsevier Inc;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
INTEGRATED CIRCUITS - Very Large Scale Integration
引用
收藏
页码：68 / 74
页数：7
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