AN ANALYTICAL DESCRIPTION OF OBSERVED STRESS PATTERNS ON X-RAY TOPOGRAPHS OF SILICON

被引：1
|
作者：
WALFORD, LK
CARRON, GJ
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1968年 / 39卷 / 12期
关键词：
D O I：
10.1063/1.1656055
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：5802 / &
相关论文
共 50 条
  • [31] CALCULATED AND OBSERVED X-RAY ANOMALOUS TRANSMISSION IN DISTORTED SILICON
    PATEL, JR
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1973, 18 (03): : 445 - 446
  • [32] Simulation of decorated dislocation images in X-ray section topographs
    Department of Physics, University of Durham, South Road, Durham, DH1 3LE, United Kingdom
    不详
    Philos. Mag. A Phys. Condens. Matter Struct. Defects Mech. Prop., 5 (1451-1474):
  • [33] Open-ended stacking-fault tetrahedra in X-ray topographs of cubic silicon carbide
    Vetter, WM
    Dudley, M
    PHILOSOPHICAL MAGAZINE LETTERS, 2003, 83 (08) : 473 - 476
  • [34] Theory of moire fringes on X-ray diffraction topographs of bicrystals
    Ohler, M
    Hartwig, J
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 413 - 422
  • [35] A METHOD FOR IMPROVING DIGITAL IMAGE COMPARISON IN X-RAY TOPOGRAPHS
    TJAHJADI, T
    BOWEN, DK
    MATERIALS LETTERS, 1987, 5 (5-6) : 227 - 231
  • [36] X-ray Photoelectron Spectromicroscopy of Doped Silicon Patterns
    Barrett, N.
    Lavayssiere, M.
    Zagonel, L. F.
    Bailly, A.
    Renault, O.
    FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009, 2009, 1173 : 99 - +
  • [37] Computer-simulated X-ray three-beam pinhole topographs for spherical silicon crystals
    Okitsu, Kouhei
    ACTA CRYSTALLOGRAPHICA SECTION A, 2011, 67 : 559 - 560
  • [38] SIMULATION OF X-RAY REFLECTION TOPOGRAPHS FROM MISFIT DISLOCATIONS
    SPIRKL, W
    TANNER, BK
    WHITEHOUSE, C
    BARNETT, SJ
    CULLIS, AG
    JOHNSON, AD
    KEIR, A
    USHER, B
    CLARK, GE
    HAGSTON, W
    HOGG, CR
    LUNN, B
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1994, 69 (01): : 221 - 236
  • [39] Simulation of decorated dislocation images in X-ray section topographs
    Holland, AJ
    Tanner, BK
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1996, 73 (05): : 1451 - 1474
  • [40] DISLOCATION CONTRAST IN X-RAY TOPOGRAPHS OF VERY THIN CRYSTALS
    TANNER, BK
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1972, 10 (02): : 381 - &
12345