AN ANALYTICAL DESCRIPTION OF OBSERVED STRESS PATTERNS ON X-RAY TOPOGRAPHS OF SILICON

被引：1

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作者：

WALFORD, LK

CARRON, GJ

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来源：

JOURNAL OF APPLIED PHYSICS | 1968年 / 39卷 / 12期

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D O I：

10.1063/1.1656055

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O59 [应用物理学];

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页码：5802 / &

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