SIMULATION OF X-RAY REFLECTION TOPOGRAPHS FROM MISFIT DISLOCATIONS

被引：10

作者：

SPIRKL, W ^{[1
]}

TANNER, BK ^{[1
]}

WHITEHOUSE, C ^{[1
]}

BARNETT, SJ ^{[1
]}

CULLIS, AG ^{[1
]}

JOHNSON, AD ^{[1
]}

KEIR, A ^{[1
]}

USHER, B ^{[1
]}

CLARK, GE ^{[1
]}

HAGSTON, W ^{[1
]}

HOGG, CR ^{[1
]}

LUNN, B ^{[1
]}

机构：

[1] UNIV DURHAM,DEPT PHYS,DURHAM DH1 3LE,ENGLAND

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1994年 / 69卷 / 01期

关键词：

D O I：

10.1080/01418619408242219

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Images of misfit dislocations as obtained from X-ray reflection topography with a low incidence angle are simulated. New algorithms for integrating numerically the Takagi-Taupin equations are presented with decoupled, variable and adaptively chosen step sizes. This reduces drastically the computation time required. The adaptive integration is faster by a factor of ten or more over integration with fixed steps, is more accurate and requires a minimum of free parameters. Rocking topographs are introduced to show the contrast variation over the Bragg peak. It is shown that the contrast of dislocations parallel to the surfaces vanishes as the depth goes to zero, for any anisotropic medium and any Burgers vector.

引用

页码：221 / 236

页数：16

共 50 条

[1] SIMULATION OF X-RAY TOPOGRAPHS
EPELBOIN, Y
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1988, 13 (02): : 135 - 155
[2] SIMULATION OF X-RAY TOPOGRAPHS
EPELBOIN, Y
MATERIALS SCIENCE AND ENGINEERING, 1985, 73 (1-2): : 1 - 43
[3] Ray Tracing Simulation of Images of Dislocations and Inclusions on X-Ray Topographs of GaAs Epitaxial Wafers
Peng, Hongyu
Ailihumaer, Tuerxun
Raghothamachar, Balaji
Dudley, Michael
JOURNAL OF ELECTRONIC MATERIALS, 2020, 49 (06) : 3472 - 3480
[4] Ray Tracing Simulation of Images of Dislocations and Inclusions on X-Ray Topographs of GaAs Epitaxial Wafers
Hongyu Peng
Tuerxun Ailihumaer
Balaji Raghothamachar
Michael Dudley
Journal of Electronic Materials, 2020, 49 : 3472 - 3480
[5] SIMULATION OF X-RAY TRAVERSE TOPOGRAPHS
EPELBOIN, Y
SOYER, A
ACTA CRYSTALLOGRAPHICA SECTION A, 1984, 40 : C345 - C345
[6] X-RAY TOPOGRAPHS
WOOSTER, N
WOOSTER, WA
NATURE, 1945, 155 (3948) : 786 - 787
[7] X-ray diffraction peaks from partially ordered misfit dislocations
Kaganer, Vladimir M.
Sabelfeld, Karl K.
PHYSICAL REVIEW B, 2009, 80 (18):
[8] X-RAY TOPOGRAPHIC STUDY OF MISFIT DISLOCATIONS IN SI
ZSOLDOS, L
ACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 : S256 - S256
[9] THE USE OF AN ARRAY PROCESSOR FOR THE SIMULATION OF X-RAY TOPOGRAPHS
SOYER, A
EPELBOIN, Y
MORRIS, F
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1985, 18 (APR) : 85 - 92
[10] SIMULATION OF X-RAY TRAVERSE TOPOGRAPHS BY MEANS OF A COMPUTER
EPELBOIN, Y
SOYER, A
ACTA CRYSTALLOGRAPHICA SECTION A, 1985, 41 (JAN): : 67 - 72

← 1 2 3 4 5 →