EXHAUSTIVE SELF-TESTING OF LSI CIRCUITS WITH AN LSSD STRUCTURE

被引：0
|
作者：
YARMOLIK, VN
KALOSHA, EP
机构：
来源：
SOVIET MICROELECTRONICS | 1988年 / 17卷 / 02期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：56 / 61
页数：6
相关论文
共 50 条
  • [31] BUILT-IN SELF-TESTING OF LOGIC-CIRCUITS USING IMPERFECT DUPLICATION
    LATYPOV, RK
    LECTURE NOTES IN COMPUTER SCIENCE, 1987, 278 : 279 - 283
  • [32] Constructing self-testing circuits with the use of step-by-step (cascade) control
    Abramov, B. B.
    Keren, O.
    Levin, I. S.
    Ostrovskii, V. I.
    AUTOMATION AND REMOTE CONTROL, 2009, 70 (07) : 1217 - 1227
  • [33] Self-Correcting. Self-Testing Circuits and Systems for Post-Manufacturing Yield Improvement
    Goyal, Abhilash
    Swaminathan, Madhavan
    Chatterjee, Abhijit
    2011 IEEE 54TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS), 2011,
  • [34] DESIGN OF SELF-TESTING AND SELF-CHECKING COMBINATIONAL-CIRCUITS WITH WEAKLY INDEPENDENT OUTPUTS
    GOESSEL, M
    SOGOMONYAN, ES
    AUTOMATION AND REMOTE CONTROL, 1992, 53 (08) : 1264 - 1272
  • [35] Constructing self-testing circuits with the use of step-by-step (cascade) control
    B. B. Abramov
    O. Keren
    I. S. Levin
    V. I. Ostrovskii
    Automation and Remote Control, 2009, 70 : 1217 - 1227
  • [36] TESTING OF DIGITAL COMPONENTS AND PRINTED-CIRCUITS - LSI CIRCUITS
    NATHER, P
    F&M-FEINWERKTECHNIK & MESSTECHNIK, 1980, 88 (06): : 298 - 304
  • [37] Self-testing: A new testing approach
    Bicevska, Zane
    Bicevskis, Janis
    DATABASES AND INFORMATION SYSTEMS, 2008, : 179 - 189
  • [38] PARTITIONING OF LOGIC-CIRCUITS FOR EXHAUSTIVE TESTING
    LALA, PK
    TAO, DL
    INTERNATIONAL JOURNAL OF ELECTRONICS, 1990, 69 (02) : 225 - 231
  • [39] Pseudo-exhaustive testing of sequential circuits
    Shaer, B
    Al-Arian, SA
    Landis, D
    NINTH GREAT LAKES SYMPOSIUM ON VLSI, PROCEEDINGS, 1999, : 109 - 112
  • [40] Self-Testing Approach and Testing Tools
    Vizulis, Valdis
    Diebelis, Edgars
    BALTIC JOURNAL OF MODERN COMPUTING, 2012, 787 : 27 - 49
12345