HIGH-RESOLUTION ELECTRON-MICROSCOPIC OBSERVATION OF DISORDERED CU-PD ALLOYS

被引：0

作者：

TANAKA, N ^{[1
]}

MIHAMA, K ^{[1
]}

机构：

[1] NAGOYA UNIV, FAC ENGN, DEPT APPL PHYS, NAGOYA, AICHI 464, JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1980年 / 29卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：330 / 330

页数：1

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