HIGH-RESOLUTION ELECTRON-MICROSCOPIC OBSERVATION OF DISORDERED CU-PD ALLOYS

被引：0
|
作者：
TANAKA, N [1 ]
MIHAMA, K [1 ]
机构：
[1] NAGOYA UNIV, FAC ENGN, DEPT APPL PHYS, NAGOYA, AICHI 464, JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1980年 / 29卷 / 03期
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：330 / 330
页数：1
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