A COMPARATIVE-STUDY OF THIN-FILM DIFFUSION MEASUREMENTS IN METALLIC GLASSES BY RUTHERFORD BACKSCATTERING SPECTROMETRY AND AUGER-ELECTRON SPECTROSCOPY

被引：0

作者：

SHARMA, SK ^{[1
]}

BANERJEE, S ^{[1
]}

KULDEEP ^{[1
]}

JAIN, AK ^{[1
]}

机构：

[1] BHABHA ATOM RES CTR,DIV NUCL PHYS,BOMBAY 400085,INDIA

来源：

THIN SOLID FILMS | 1988年 / 164卷

关键词：

D O I：

10.1016/0040-6090(88)90105-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：33 / 36

页数：4

共 50 条

[41] ELECTRON INELASTIC MEAN FREE-PATH (IMFP) IN SINGLE-CRYSTAL BEO BY RUTHERFORD BACKSCATTERING (RBS) AND AUGER-ELECTRON SPECTROSCOPY (AES)
FOWLER, DE
GYULAI, J
PALMSTROM, C
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02): : 1021 - 1025
[42] DEPTH PROFILE MEASUREMENTS OF AN ANODIZING ALUMINUM-OXIDE FILM BY AUGER-ELECTRON SPECTROSCOPY
KOJIMA, I
FUKUMOTO, N
KURAHASHI, M
SATO, K
TAKAHASHI, M
IIDA, T
BUNSEKI KAGAKU, 1991, 40 (11) : 811 - 816
[43] ANNEALING EFFECT OF SNO2 FILMS PREPARED BY CHEMICAL VAPOR-DEPOSITION - EVIDENCE OF CHLORINE REMOVAL BY AUGER-ELECTRON SPECTROSCOPY AND RUTHERFORD BACKSCATTERING SPECTROMETRY STUDIES
KIM, K
FINSTAD, TG
CHU, WK
COX, XB
LINTON, RW
SOLAR CELLS, 1985, 13 (03): : 301 - 307
[44] USE OF VALENCE-BAND AUGER-ELECTRON SPECTROSCOPY TO STUDY THIN-FILM GROWTH - OXIDE AND DIAMOND-LIKE CARBON-FILMS
STEFFEN, HJ
THIN SOLID FILMS, 1994, 253 (1-2) : 269 - 276
[45] STUDY OF THE NUCLEATION PROCESS IN THIN FILMS BY THE AUGER-ELECTRON SPECTROSCOPY METHOD.
Tyuliyev, G.T.
Yelovikov, S.S.
Dubinina, Ye.M.
Radio Engineering and Electronic Physics (English translation of Radiotekhnika i Elektronika), 1981, 26 (10): : 101 - 104
[46] Investigation of the Intercalation and Deintercalation of Lithium Ions in a Thin-Film Lithium-Ion Battery by Rutherford Backscattering Spectrometry
S. V. Kurbatov
N. S. Melesov
E. O. Parshin
A. S. Rudy
A. A. Mironenko
V. V. Naumov
A. M. Skundin
V. I. Bachurin
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2024, 18 (6) : 1374 - 1381
[47] DIFFUSION STUDIES IN CR-PT THIN-FILMS USING AUGER-ELECTRON SPECTROSCOPY
DANYLUK, S
MCGUIRE, GE
KOLIWAD, KM
YANG, MG
THIN SOLID FILMS, 1975, 25 (02) : 483 - 489
[48] DIFFUSION STUDIES IN THE METALLIC-GLASS ZR61NI39 BY AUGER-ELECTRON SPECTROSCOPY
SHARMA, SK
MUKHOPADHYAY, P
ACTA METALLURGICA ET MATERIALIA, 1990, 38 (01): : 129 - 133
[49] QUANTITATIVE-ANALYSIS OF THIN FILM-SUBSTRATE INTERDIFFUSION BY GDOS AND BY AUGER-ELECTRON SPECTROSCOPY
WEISS, Z
SUBA, J
CZECHOSLOVAK JOURNAL OF PHYSICS, 1992, 42 (05) : 539 - 544
[50] STUDY OF THE GROWTH MODE OF A THIN SILVER DEPOSIT ON SILICIUM USING AUGER-ELECTRON SPECTROMETRY
VIGNES, JL
DENJEAN, P
LEHERICY, J
LANGERON, JP
VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1985, 40 (226): : 209 - 209

← 1 2 3 4 5 →