A COMPARATIVE-STUDY OF THIN-FILM DIFFUSION MEASUREMENTS IN METALLIC GLASSES BY RUTHERFORD BACKSCATTERING SPECTROMETRY AND AUGER-ELECTRON SPECTROSCOPY

被引：0

作者：

SHARMA, SK ^{[1
]}

BANERJEE, S ^{[1
]}

KULDEEP ^{[1
]}

JAIN, AK ^{[1
]}

机构：

[1] BHABHA ATOM RES CTR,DIV NUCL PHYS,BOMBAY 400085,INDIA

来源：

THIN SOLID FILMS | 1988年 / 164卷

关键词：

D O I：

10.1016/0040-6090(88)90105-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：33 / 36

页数：4

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