ELECTRON-MICROSCOPY OF INTERFACES BETWEEN TRANSFORMING POLYTYPES IN SILICON-CARBIDE

被引：29
|
作者：
JEPPS, NW
PAGE, TF
机构：
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1979年 / 116卷 / MAY期
关键词：
D O I：
10.1111/j.1365-2818.1979.tb00199.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：159 / 171
页数：13
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