共 50 条
- [42] A NEW TYPE PATTERN GENERATOR APPLIED TO THE ELECTRON-BEAM EXPOSURE SYSTEM JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (04): : 975 - 978
- [44] A THERMALLY ASSISTED FIELD-EMISSION ELECTRON-BEAM EXPOSURE SYSTEM JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (06): : 2019 - 2022
- [45] Precision improvement for the calibration of submicron dimension reference for electron-beam metrology system METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XII, 1998, 3332 : 560 - 567
- [46] DEFLECTOR AND CORRECTION COIL CALIBRATIONS IN AN ELECTRON-BEAM BLOCK EXPOSURE SYSTEM JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (06): : 3404 - 3408
- [47] A HIGH-SPEED, HIGH-PRECISION ELECTRON-BEAM LITHOGRAPHY SYSTEM (ELECTRON OPTICS) JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (01): : 98 - 101
- [48] SYSTEM FOR AUTOMATIC GUIDANCE OF ELECTRON-BEAM ALONG JOINT IN ELECTRON-BEAM WELDING WELDING PRODUCTION, 1976, 23 (03): : 13 - 15
- [49] A NOVEL HIGH-SPEED NANOMETRIC ELECTRON-BEAM LITHOGRAPHY SYSTEM - EB-F JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (01): : 75 - 78
- [50] A HIGH-SPEED PATTERNING CONTROLLER FOR THE EB60 ELECTRON-BEAM LITHOGRAPHY SYSTEM JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (01): : 66 - 69