METHODS FOR RADIATION TESTING RANDOM-ACCESS MEMORIES AND LSI CIRCUITS

被引：3

|

作者：

NELSON, GP

KING, EE

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1977年 / 24卷 / 06期

关键词：

D O I：

10.1109/TNS.1977.4329218

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：2341 / 2346

页数：6

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