LASER-BEAM TESTING OF FINISHED INTEGRATED-CIRCUITS

被引：0

作者：

AUVERT, G

机构：

来源：

INSTITUTE OF PHYSICS CONFERENCE SERIES | 1987年 / 87期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：563 / 572

页数：10

共 50 条

[31] ECONOMIC-CONSIDERATIONS OF TESTING INTEGRATED-CIRCUITS
NUTBURN, PG
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[32] AN APPLICATION OF FOCUSED ION-BEAMS TO ELECTRON-BEAM TESTING OF INTEGRATED-CIRCUITS
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[33] PRODUCTION OF MICROWAVE INTEGRATED-CIRCUITS BY LASER MACHINING
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[34] NUMERICAL SIMULATIONS TO IMPROVE THE ACCURACY OF ELECTRON-BEAM TESTING ON PASSIVATED INTEGRATED-CIRCUITS
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[35] INTEGRATED-CIRCUITS
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[39] ELECTRON-BEAM TEST TECHNIQUES FOR INTEGRATED-CIRCUITS
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[40] ELECTRON-BEAM SYSTEM TO FABRICATE INTEGRATED-CIRCUITS
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