共 50 条
- [22] TESTING OF RANDOM-ACCESS MEMORIES - THEORY AND PRACTICE IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS, 1988, 135 (01): : 24 - 28
- [23] On internal organization in compressed random-access memories Franaszek, P.A. (paf@us.ibm.com), 1600, IBM Corporation (45):
- [29] ON-CHIP TESTING OF RANDOM-ACCESS MEMORIES JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1994, 5 (04): : 367 - 376
- [30] Nonvolatile random-access memories in silicon carbide 2003 IEEE CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS, 2003, : 405 - 409