首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
ELECTRICAL AND STRUCTURAL-PROPERTIES OF CADMIUM SELENIDE THIN-FILM TRANSISTORS
被引:12
|
作者
:
LEE, MJ
论文数:
0
引用数:
0
h-index:
0
LEE, MJ
WRIGHT, SW
论文数:
0
引用数:
0
h-index:
0
WRIGHT, SW
JUDGE, CP
论文数:
0
引用数:
0
h-index:
0
JUDGE, CP
机构
:
来源
:
SOLID-STATE ELECTRONICS
|
1980年
/ 23卷
/ 06期
关键词
:
D O I
:
10.1016/0038-1101(80)90053-2
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:671 / &
相关论文
共 50 条
[41]
Tunable electrical properties of NiO thin films and p-type thin-film transistors
Chen, Yongyue
论文数:
0
引用数:
0
h-index:
0
机构:
Zhejiang Univ, Dept Phys, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Zhejiang Univ, Dept Phys, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Chen, Yongyue
Sun, Yajie
论文数:
0
引用数:
0
h-index:
0
机构:
Zhejiang Univ, Dept Phys, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Zhejiang Univ, Dept Phys, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Sun, Yajie
Dai, Xusheng
论文数:
0
引用数:
0
h-index:
0
机构:
Zhejiang Univ, Dept Phys, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Zhejiang Univ, Dept Phys, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Dai, Xusheng
Zhang, Bingpo
论文数:
0
引用数:
0
h-index:
0
机构:
Zhejiang Univ, Dept Phys, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Zhejiang Univ, Dept Phys, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Zhang, Bingpo
Ye, Zhenyu
论文数:
0
引用数:
0
h-index:
0
机构:
Zhejiang Univ, Dept Phys, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Zhejiang Univ, Dept Phys, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Ye, Zhenyu
Wang, Miao
论文数:
0
引用数:
0
h-index:
0
机构:
Zhejiang Univ, Dept Phys, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Zhejiang Univ, Dept Phys, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Wang, Miao
Wu, Huizhen
论文数:
0
引用数:
0
h-index:
0
机构:
Zhejiang Univ, Dept Phys, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Zhejiang Univ, Dept Phys, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Wu, Huizhen
THIN SOLID FILMS,
2015,
592
: 195
-
199
[42]
THIN-FILM TRANSISTORS
ANDERSON, JC
论文数:
0
引用数:
0
h-index:
0
ANDERSON, JC
ELECTRONICS AND POWER,
1969,
15
(MAR):
: 90
-
&
[43]
Thin-Film Transistors
Street, Robert A.
论文数:
0
引用数:
0
h-index:
0
机构:
Xerox Corp, Palo Alto Res Ctr, Palo Alto, CA 94304 USA
Xerox Corp, Palo Alto Res Ctr, Palo Alto, CA 94304 USA
Street, Robert A.
ADVANCED MATERIALS,
2009,
21
(20)
: 2007
-
2022
[44]
Thin-Film Transistors
论文数:
引用数:
h-index:
机构:
Chien, Feng-Tso
Chang, Yu-Wei
论文数:
0
引用数:
0
h-index:
0
机构:
Feng Chia Univ, Dept Elect Engn, Taichung 407, Taiwan
Feng Chia Univ, Dept Elect Engn, Taichung 407, Taiwan
Chang, Yu-Wei
Liu, Jo-Chin
论文数:
0
引用数:
0
h-index:
0
机构:
Feng Chia Univ, Dept Elect Engn, Taichung 407, Taiwan
Feng Chia Univ, Dept Elect Engn, Taichung 407, Taiwan
Liu, Jo-Chin
MEMBRANES,
2022,
12
(04)
[45]
ELECTRICAL PROPERTIES OF THIN-FILM SEMICONDUCTORS
HAM, FS
论文数:
0
引用数:
0
h-index:
0
HAM, FS
MATTIS, DC
论文数:
0
引用数:
0
h-index:
0
MATTIS, DC
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1960,
4
(02)
: 143
-
151
[46]
A study of structural, morphological, optical and electrical properties of Zinc Selenide (ZnSe) thin film
Thirumavalavan, S.
论文数:
0
引用数:
0
h-index:
0
机构:
Sathyabama Univ, Dept Mech Engn, Chennai 600119, Tamil Nadu, India
Sathyabama Univ, Dept Mech Engn, Chennai 600119, Tamil Nadu, India
Thirumavalavan, S.
Mani, K.
论文数:
0
引用数:
0
h-index:
0
机构:
Panimalar Engn Coll, Dept Mech Engn, Chennai 602103, Tamil Nadu, India
Sathyabama Univ, Dept Mech Engn, Chennai 600119, Tamil Nadu, India
Mani, K.
论文数:
引用数:
h-index:
机构:
Sagadevan, Suresh
MATERIALS TODAY-PROCEEDINGS,
2016,
3
(06)
: 2305
-
2314
[47]
THIN-FILM TRANSISTORS
ANDERSON, JC
论文数:
0
引用数:
0
h-index:
0
机构:
IMPERIAL COLL,DEPT ELECT ENGN,SECT MAT,LONDON SW7 2BT,ENGLAND
IMPERIAL COLL,DEPT ELECT ENGN,SECT MAT,LONDON SW7 2BT,ENGLAND
ANDERSON, JC
THIN SOLID FILMS,
1976,
36
(02)
: 299
-
312
[48]
Effect of air annealing on structural, optical, microscopic, electrical properties of cadmium selenide thin films
P. P. Hankare
论文数:
0
引用数:
0
h-index:
0
机构:
Shivaji University,Solid State Research Laboratory, Department of Chemistry
P. P. Hankare
P. A. Chate
论文数:
0
引用数:
0
h-index:
0
机构:
Shivaji University,Solid State Research Laboratory, Department of Chemistry
P. A. Chate
D. J. Sathe
论文数:
0
引用数:
0
h-index:
0
机构:
Shivaji University,Solid State Research Laboratory, Department of Chemistry
D. J. Sathe
A. A. Patil
论文数:
0
引用数:
0
h-index:
0
机构:
Shivaji University,Solid State Research Laboratory, Department of Chemistry
A. A. Patil
Journal of Materials Science: Materials in Electronics,
2009,
20
: 776
-
781
[49]
Effect of air annealing on structural, optical, microscopic, electrical properties of cadmium selenide thin films
Hankare, P. P.
论文数:
0
引用数:
0
h-index:
0
机构:
Shivaji Univ, Dept Chem, Solid State Res Lab, Kolhapur 416004, MS, India
JSM Coll, Dept Chem, Alibag 402201, MS, India
Hankare, P. P.
Chate, P. A.
论文数:
0
引用数:
0
h-index:
0
机构:
JSM Coll, Dept Chem, Alibag 402201, MS, India
JSM Coll, Dept Chem, Alibag 402201, MS, India
Chate, P. A.
Sathe, D. J.
论文数:
0
引用数:
0
h-index:
0
机构:
Shivaji Univ, Dept Chem, Solid State Res Lab, Kolhapur 416004, MS, India
JSM Coll, Dept Chem, Alibag 402201, MS, India
Sathe, D. J.
Patil, A. A.
论文数:
0
引用数:
0
h-index:
0
机构:
Shivaji Univ, Dept Chem, Solid State Res Lab, Kolhapur 416004, MS, India
JSM Coll, Dept Chem, Alibag 402201, MS, India
Patil, A. A.
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,
2009,
20
(08)
: 776
-
781
[50]
THIN-FILM CADMIUM SELENIDE PREPARED FROM CADMIUM-OXIDE FORMED BY SPRAY PYROLYSIS
WENG, SX
论文数:
0
引用数:
0
h-index:
0
机构:
University of Guelph, Guelph
WENG, SX
COCIVERA, M
论文数:
0
引用数:
0
h-index:
0
机构:
University of Guelph, Guelph
COCIVERA, M
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1992,
139
(11)
: 3220
-
3224
←
1
2
3
4
5
→