FAULT-TOLERANT 64K DYNAMIC RANDOM-ACCESS MEMORY

被引：65
|
作者：
CENKER, RP
CLEMONS, DG
HUBER, WR
PETRIZZI, JB
PROCYK, FJ
TROUT, GM
机构：
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1979年 / 26卷 / 06期
关键词：
D O I：
10.1109/T-ED.1979.19509
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：853 / 860
页数：8
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