APPLICATION OF DYNAMIC BACKGROUND SUBTRACTION TO QUANTIFICATION OF AUGER-ELECTRON AND SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPIES

被引：0

作者：

GRANT, JT

HAAS, TW

HOUSTON, JE

机构：

[1] USAF,AEROSP RES LABS,WRIGHT PATTERSON AFB,OH 45433

[2] SANDIA LABS,ALBUQUERQUE,NM 87115

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1974年

关键词：

D O I：

暂无

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：811 / 814

页数：4

共 50 条

[1] COMPARISON OF SOFT-X-RAY AND AUGER-ELECTRON APPEARANCE POTENTIAL SPECTROSCOPY
HOUSTON, JE
PARK, RL
[J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1972, 17 (05): : 662 - &
[2] QUANTITATIVE COMPARISON OF TI AND TIO SURFACES USING AUGER-ELECTRON AND SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPIES
GRANT, JT
HAAS, TW
HOUSTON, JE
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01): : 227 - 230
[3] GEOMETRICAL INFORMATION IN SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPY AND AUGER-ELECTRON APPEARANCE POTENTIAL SPECTROSCOPY
LARAMORE, GE
[J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 335 - 336
[4] GEOMETRICAL INFORMATION IN SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPY AND AUGER-ELECTRON APPEARANCE POTENTIAL SPECTROSCOPY
LARAMORE, GE
[J]. PHYSICAL REVIEW B, 1978, 18 (10): : 5254 - 5264
[5] DIRECT COMPARISON OF FINE-STRUCTURE ON TIL3 THRESHOLD BY DISAPPEARANCE POTENTIAL AND AUGER-ELECTRON AND SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPIES
NISHIMORI, K
TOKUTAKA, H
KOHNO, M
ISHIHARA, N
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1984, 23 (06): : L366 - L368
[6] AUGER-ELECTRON AND X-RAY PHOTOELECTRON SPECTROSCOPIES
HOCHELLA, MF
[J]. REVIEWS IN MINERALOGY, 1988, 18 : 573 - 637
[7] STUDY OF THE TI/SI INTERFACE USING X-RAY PHOTOELECTRON AND AUGER-ELECTRON APPEARANCE POTENTIAL SPECTROSCOPIES
CHOPRA, DR
CHOURASIA, AR
DILLINGHAM, TR
PETERSON, KL
GNADE, B
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04): : 1984 - 1987
[8] QUASI-INSTANTANEOUS MEASUREMENTS OF TITANIUM COMPOUNDS USING AUGER-ELECTRON AND AUGER-ELECTRON APPEARANCE POTENTIAL SPECTROSCOPIES
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KATO, S
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1984, 23 (08): : 975 - 978
[9] MEASUREMENTS OF THE BREMSSTRAHLUNG BACKGROUND IN SOFT-X-RAY APPEARANCE-POTENTIAL SPECTROSCOPY
SHINDE, PS
PADALIA, BD
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 82 (01): : 196 - 199
[10] SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPY
PARK, RL
HOUSTON, JE
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01): : 1 - 18

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